Back reflection effect at the fundamental edge of semiconductors in modulated reflectivity measurements

TitleBack reflection effect at the fundamental edge of semiconductors in modulated reflectivity measurements
Publication TypeJournal Article
Year of Publication1987
AuthorsGagnon, R, Bernier, G, Jandl, S, Aubin, M
JournalSolid State Communications
Volume64
Pagination361-365
Full Text
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