Back reflection effect at the fundamental edge of semiconductors in modulated reflectivity measurements

TitreBack reflection effect at the fundamental edge of semiconductors in modulated reflectivity measurements
Type de publicationJournal Article
Nouvelles publications1987
AuteursGagnon, R, Bernier, G, Jandl, S, Aubin, M
JournalSolid State Communications
Volume64
Pagination361-365
Texte complet
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